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ASPDAC   2015 Asia and South Pacific Design Automation Conference
Wall of Fame | Most Viewed ASPDAC-2015 Paper
ASPDAC
2015
ACM
36views Hardware» more  ASPDAC 2015»
4 years 9 months ago
Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space
- Accurately estimating the rare failure rates for nanoscale memory circuits is a challenging task, especially when the variation space is high-dimensional. In this paper, we summa...
Shupeng Sun, Xin Li 0001
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