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ATS   2001 Asian Test Symposium
Wall of Fame | Most Viewed ATS-2001 Paper
ATS
2001
IEEE
172views Hardware» more  ATS 2001»
9 years 3 months ago
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih...
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