ATS   2004 Asian Test Symposium
Wall of Fame | Most Viewed ATS-2004 Paper
126views Hardware» more  ATS 2004»
10 years 10 months ago
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumptio
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Ya...
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website. Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
1Download preprint from source126
2Download preprint from source116
3Download preprint from source109
4Download preprint from source108
5Download preprint from source97
6Download preprint from source93
7Download preprint from source87
8Download preprint from source69