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ATS   2004 Asian Test Symposium
Wall of Fame | Most Viewed ATS-2004 Paper
ATS
2004
IEEE
126views Hardware» more  ATS 2004»
9 years 6 hour ago
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumptio
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Ya...
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