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ATS   2009 Asian Test Symposium
Wall of Fame | Most Viewed ATS-2009 Paper
ATS
2009
IEEE
185views Hardware» more  ATS 2009»
9 years 8 months ago
Customized Algorithms for High Performance Memory Test in Advanced Technology Node
Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
Shomo Chen, Ning Huang, Ting-Pu Tai, Actel Niu
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