ATS   2009 Asian Test Symposium
Wall of Fame | Most Viewed ATS-2009 Paper
185views Hardware» more  ATS 2009»
9 years 8 months ago
Customized Algorithms for High Performance Memory Test in Advanced Technology Node
Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
Shomo Chen, Ning Huang, Ting-Pu Tai, Actel Niu
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website. Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
1Download preprint from source185
2Download preprint from source162
3Download preprint from source142
4Download preprint from source138
5Download preprint from source135
6Download preprint from source132
7Download preprint from source127
8Download preprint from source126
9Download preprint from source119
10Download preprint from source117
11Download preprint from source113
12Download preprint from source111
13Download preprint from source99
14Download preprint from source98
15Download preprint from source92
16Download preprint from source92