ATS 2009 - PDF Preprint Papers

ATS 2009 Asian Test Symposium

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ATS
2009
IEEE

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Customized Algorithms for High Performance Memory Test in Advanced Technology Node

13 years 11 months ago

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Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...

Shomo Chen, Ning Huang, Ting-Pu Tai, Actel Niu

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Id	Views	Title	Status

1	185	Customized Algorithms for High Performance Memory Test in Advanced Technology Node	claim
2	162	Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients	claim
3	142	Speeding up SAT-Based ATPG Using Dynamic Clause Activation	claim
4	138	Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks	claim
5	135	On Scan Chain Diagnosis for Intermittent Faults	claim
6	132	On Improving Diagnostic Test Generation for Scan Chain Failures	claim
7	127	On the Generation of Functional Test Programs for the Cache Replacement Logic	claim
8	126	Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns	claim
9	119	Fault Diagnosis Using Test Primitives in Random Access Memories	claim
10	117	N-distinguishing Tests for Enhanced Defect Diagnosis	claim
11	113	Deterministic Algorithms for ATPG under Leakage Constraints	claim
12	111	Dynamic Compaction in SAT-Based ATPG	claim
13	99	Test Generation for Designs with On-Chip Clock Generators	claim
14	98	Scan Compression Implementation in Industrial Design - Case Study	claim
15	92	New Class of Tests for Open Faults with Considering Adjacent Lines	claim
16	92	M-IVC: Using Multiple Input Vectors to Minimize Aging-Induced Delay	claim

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