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CSREAESA   2008
Wall of Fame | Most Viewed CSREAESA-2008 Paper
CSREAESA
2008
8 years 2 months ago
BIST-BASED Group Testing for Diagnosis of Embedded FPGA Cores
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
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