DFT 1997 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
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Wall of Fame | Most Viewed DFT-1997 Paper
DFT
1997
IEEE
13 years 8 months ago
1997
IEEE
Recent increases in the density and size of memory ICs made it ne cessary to search for new defect tolerance techniques since the traditional methods are no longer e ective enough...
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