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DFT   2003 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Wall of Fame | Most Viewed DFT-2003 Paper
DFT
2003
IEEE
246views VLSI» more  DFT 2003»
10 years 2 months ago
Low Cost Convolutional Code Based Concurrent Error Detection in FSMs
We discuss the use of convolutional codes to perform concurrent error detection (CED) in finite state machines (FSMs). We examine a previously proposed methodology, we identify i...
Konstantinos Rokas, Yiorgos Makris, Dimitris Gizop...
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