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DFT   2005 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Wall of Fame | Most Viewed DFT-2005 Paper
DFT
2005
IEEE
200views VLSI» more  DFT 2005»
9 years 5 months ago
Data Dependent Jitter (DDJ) Characterization Methodology
A new jitter model is developed using Matlab and Spice to analyze Data Dependent Jitter (DDJ) in serial data integrated circuits. The simulation results show that DDJ is dependent...
Kyung Ki Kim, Yong-Bin Kim, Fabrizio Lombardi
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