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EVOW   1999 Process in Evolutionary Computation Workshop
Wall of Fame | Most Viewed EVOW-1999 Paper
EVOW
1999
Springer
13 years 8 months ago
Test Pattern Generation Under Low Power Constraints
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...
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