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ICCAD   2003 International Conference on Computer-Aided Design
Wall of Fame | Most Viewed ICCAD-2003 Paper
ICCAD
2003
IEEE
379views Hardware» more  ICCAD 2003»
9 years 5 months ago
A Statistical Gate-Delay Model Considering Intra-Gate Variability
This paper proposes a model for calculating statistical gate-delay variation caused by intra-chip and inter-chip variability. As the variation of individual gate delays directly i...
Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera
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