ICES 2000 International Conference on Evolvable Systems
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Wall of Fame | Most Viewed ICES-2000 Paper
ICES
2000
Springer
13 years 8 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
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