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ICST   2010 Verification Software Testing
Wall of Fame | Most Viewed ICST-2010 Paper
ICST
2010
IEEE
8 years 3 months ago
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit ...
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