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IOLTS   2005 IEEE International On-Line Testing Symposium
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IOLTS
2005
IEEE
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13 years 9 months ago
A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir
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