IOLTS 2008 - PDF Preprint Papers

IOLTS 2008 IEEE International On-Line Testing Symposium

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IOLTS
2008
IEEE

117views Hardware» more IOLTS 2008»

Verification and Analysis of Self-Checking Properties through ATPG

13 years 11 months ago

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Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...

Marc Hunger, Sybille Hellebrand

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Id	Views	Title	Status

1	117	Verification and Analysis of Self-Checking Properties through ATPG	claim
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