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IOLTS   2008 IEEE International On-Line Testing Symposium
Wall of Fame | Most Viewed IOLTS-2008 Paper
IOLTS
2008
IEEE
117views Hardware» more  IOLTS 2008»
8 years 7 months ago
Verification and Analysis of Self-Checking Properties through ATPG
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
Marc Hunger, Sybille Hellebrand
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