ISQED 2011 - PDF Preprint Papers

ISQED 2011 International Symposium on Quality Electronic Design

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ISQED
2011
IEEE

89views Hardware» more ISQED 2011»

Switching constraint-driven thermal and reliability analysis of Nanometer designs

9 months 4 days ago

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As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...

Srini Krishnamoorthy, Vishak Venkatraman, Yuri Apa...

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