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ISQED   2011 International Symposium on Quality Electronic Design
Wall of Fame | Most Viewed ISQED-2011 Paper
ISQED
2011
IEEE
398views Hardware» more  ISQED 2011»
8 years 2 months ago
Switching constraint-driven thermal and reliability analysis of Nanometer designs
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
Srini Krishnamoorthy, Vishak Venkatraman, Yuri Apa...
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