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ITC   1989 International Test Conference
Wall of Fame | Most Viewed ITC-1989 Paper
ITC
1989
IEEE
82views Hardware» more  ITC 1989»
10 years 8 months ago
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...
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