ITC 2002 - PDF Preprint Papers

ITC 2002 International Test Conference

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ITC
2002
IEEE

143views Hardware» more ITC 2002»

BIST-Based Diagnosis of FPGA Interconnect

13 years 9 months ago

Download www.eng.auburn.edu

: We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...

Charles E. Stroud, Jeremy Nall, Matthew Lashinsky,...

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Id	Views	Title	Status

1	143	BIST-Based Diagnosis of FPGA Interconnect	claim
2	135	Test Coverage: What Does It Mean When a Board Test Passes?	claim
3	133	A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits	claim
4	127	A New Test Generation Approach for Embedded Analogue Cores in SoC	claim
5	114	Scan Power Reduction Through Test Data Transition Frequency Analysis	claim
6	112	Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis	claim
7	102	Adapting an SoC to ATE Concurrent Test Capabilities	claim
8	102	Fault Grading FPGA Interconnect Test Configurations	claim
9	99	Verifying Properties Using Sequential ATPG	claim
10	99	An Embedded Core for Sub-Picosecond Timing Measurements	claim
11	98	An Effective Diagnosis Method to Support Yield Improvement	claim
12	98	A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets	claim
13	97	A Multi-Language Goal-Tree Based Functional Test Planning System	claim
14	97	RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST	claim
15	94	Techniques to Reduce Data Volume and Application Time for Transition Test	claim
16	88	Embedded Deterministic Test for Low-Cost Manufacturing Test	claim
17	86	Incremental Diagnosis of Multiple Open-Interconnects	claim
18	84	Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems	claim
19	83	Packet-Based Input Test Data Compression Techniques	claim
20	81	Design Rewiring Using ATPG	claim
21	80	Screening MinVDD Outliers Using Feed-Forward Voltage Testing	claim
22	77	Signal Integrity Loss in SoC's Interconnects: A Diagnosis Approach Using Embedded Microprocessor	claim
23	72	Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume	claim

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