MEMOCODE 2007 ACM/IEEE International Conference on Formal Methods and Models for Co-Design
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Wall of Fame | Most Viewed MEMOCODE-2007 Paper
MEMOCODE
2007
IEEE
13 years 10 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
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