MTDT 2006 Design and Testin Memory Technology
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Wall of Fame | Most Viewed MTDT-2006 Paper
MTDT
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper highlights the cell current characterization of a low leakage 6T SRAM by adjusting the threshold voltages of the transistors in the memory array to reduce the standby p...
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