SEUS 2010 - PDF Preprint Papers

SEUS 2010 IEEE Workshop on Software Technologies for Future Embedded and Ubiquitous Systems

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SEUS
2010
IEEE

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Error Detection Rate of MC/DC for a Case Study from the Automotive Domain

1 years 3 months ago

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Chilenski and Miller [1] claim that the error detection probability of a test set with full modiﬁed condition/decision coverage (MC/DC) on the system under test converges to 100%...

Susanne Kandl, Raimund Kirner

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