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VLSID   2010 International Conference on VLSI Design
Wall of Fame | Most Viewed VLSID-2010 Paper
VLSID
2010
IEEE
211views VLSI» more  VLSID 2010»
13 years 8 months ago
A Combined DOE-ILP Based Power and Read Stability Optimization in Nano-CMOS SRAM
A novel design approach for simultaneous power and stability (static noise margin, SNM) optimization of nanoCMOS static random access memory (SRAM) is presented. A 45nm single-end...
Garima Thakral, Saraju P. Mohanty, Dhruva Ghai, Dh...
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