VTS 2002 - PDF Preprint Papers

VTS 2002 IEEE VLSI Test Symposium

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VTS
2002
IEEE

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Self-Testing Second-Order Delta-Sigma Modulators Using Digital Stimulus

13 years 9 months ago

Download cadlab.ece.ucsb.edu

Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is difﬁc...

Chee-Kian Ong, Kwang-Ting (Tim) Cheng

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Id	Views	Title	Status

1	162	Self-Testing Second-Order Delta-Sigma Modulators Using Digital Stimulus	claim
2	138	Test Power Reduction through Minimization of Scan Chain Transitions	claim
3	135	A Self Calibrated ADC BIST Methodology	claim
4	128	Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models	claim
5	126	On Using Rectangle Packing for SOC Wrapper/TAM Co-Optimization	claim
6	124	Approximating Infinite Dynamic Behavior for DRAM Cell Defects	claim
7	121	Very Low Voltage Testing of SOI Integrated Circuits	claim
8	120	Test Pattern Generation for Signal Integrity Faults on Long Interconnects	claim
9	120	Software-Based Weighted Random Testing for IP Cores in Bus-Based Programmable SoCs	claim
10	113	Testing Static and Dynamic Faults in Random Access Memories	claim
11	113	LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects	claim
12	109	Controlling Peak Power During Scan Testing	claim
13	108	An Industrial Environment for High-Level Fault-Tolerant Structures Insertion and Validation	claim
14	108	On Using Efficient Test Sequences for BIST	claim
15	107	Testing High-Speed SoCs Using Low-Speed ATEs	claim
16	106	How Effective are Compression Codes for Reducing Test Data Volume?	claim
17	101	Speeding Up The Byzantine Fault Diagnosis Using Symbolic Simulation	claim

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