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VTS   2005 IEEE VLSI Test Symposium
Wall of Fame | Most Viewed VTS-2005 Paper
VTS
2005
IEEE
178views Hardware» more  VTS 2005»
10 years 9 months ago
Data Retention Fault in SRAM Memories: Analysis and Detection Procedures
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
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