DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
13 years 11 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
DNA probe arrays have emerged as a core genomic technology that enables cost-effective gene expression monitoring, mutation detection, single nucleotide polymorphism analysis and ...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
Modern design requirements have brought additional complexities to netlists and layouts. Millions of components, whitespace resources, and fixed/movable blocks are just a few to ...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
A priori wirelength estimation is concerned with predicting various wirelength characteristics before placement. In this work we propose a novel, accurate estimator of net lengths...
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
