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VTS
2000
IEEE

Cold Delay Defect Screening

13 years 8 months ago
Cold Delay Defect Screening
Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types can have their delay increased, making them easier to detect, by carrying out the test with a very low supply voltage (VLV testing). However, VLV testing is not effective for some delay defects such as high resistance interconnnects. This paper presents a screening technique for such defects. This technique relies on carrying out the test at low temperature. One particular type of defect, salicide resistive opens, is analyzed and experimental data is presented to demonstrate the effectiveness of cold testing.
Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao
Added 01 Aug 2010
Updated 01 Aug 2010
Type Conference
Year 2000
Where VTS
Authors Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu
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