Sciweavers

ATS
1998
IEEE

A BIST Structure to Test Delay Faults in a Scan Environment

13 years 8 months ago
A BIST Structure to Test Delay Faults in a Scan Environment
Patrick Girard, Christian Landrault, V. Moreda, Se
Added 04 Aug 2010
Updated 04 Aug 2010
Type Conference
Year 1998
Where ATS
Authors Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel
Comments (0)