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VTS
1998
IEEE

On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits

13 years 7 months ago
On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the proposed approach, called C2 BIST (Circular Cellular BIST) is that the same CA is used for generation and compaction, thus lowering substantially the area requirements. The configuration of the CA rules is performed through a Genetic Algorithm, that is shown to provide good results both in terms of fault coverage and number of reconfigurations. In many cases, no reconfiguration is necessary, and the corresponding area occupation is competitive with current BIST approaches.
Fulvio Corno, Nicola Gaudenzi, Paolo Prinetto, Mat
Added 05 Aug 2010
Updated 05 Aug 2010
Type Conference
Year 1998
Where VTS
Authors Fulvio Corno, Nicola Gaudenzi, Paolo Prinetto, Matteo Sonza Reorda
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