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DATE
1997
IEEE

Compact structural test generation for analog macros

13 years 7 months ago
Compact structural test generation for analog macros
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test set.
V. Kaal, Hans G. Kerkhoff
Added 06 Aug 2010
Updated 06 Aug 2010
Type Conference
Year 1997
Where DATE
Authors V. Kaal, Hans G. Kerkhoff
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