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ITC
1997
IEEE

Fault Diagnosis in Scan-Based BIST

13 years 7 months ago
Fault Diagnosis in Scan-Based BIST
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the analysis phase of the diagnosis algorithm improves diagnosis times significantly; furthermore, the deterministic partitioning approach results in even further reductions in diagnosis times together with higher predictability.
Janusz Rajski, Jerzy Tyszer
Added 06 Aug 2010
Updated 06 Aug 2010
Type Conference
Year 1997
Where ITC
Authors Janusz Rajski, Jerzy Tyszer
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