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4

ICCAD
1990
IEEE

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Partial Detectability Profiles

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Partial Detectability Profiles

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Partial detectability profiles are formed by randomly sampling each fault's detectability and are used in estimating the fault coverage of random input test vectors on combinational circuits. Partial detectability profiles are particularly useful for predicting fault coverage for large circuits with a large number of inputs. Predictions made using full and partial detectability profiles are compared.

Paul G. Ryan, W. Kent Fuchs

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Added	11 Aug 2010
Updated	11 Aug 2010
Type	Conference
Year	1990
Where	ICCAD
Authors	Paul G. Ryan, W. Kent Fuchs

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