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ICCAD
2008
IEEE

On capture power-aware test data compression for scan-based testing

14 years 15 days ago
On capture power-aware test data compression for scan-based testing
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the “don’t-care” bits can be exploited for test data compression and/or test power reduction. Prior work either targets only one of these two issues or considers to reduce test data volume and scan shift power together. In this paper, we propose a novel capture power-aware test compression scheme that is able to keep scan capture power under a safe limit with little loss in test compression ratio. Experimental results on benchmark circuits demonstrate the efficacy of the proposed approach.
Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li,
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2008
Where ICCAD
Authors Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu
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