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    1998
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    An almost full-scan BIST solution-higher fault coverage and shorter test application time

    13 years 9 months ago
    An almost full-scan BIST solution-higher fault coverage and shorter test application time
    Download  cadlab.ece.ucsb.edu
    Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng
    claim paper
    Added 05 Aug 2010
    Updated 05 Aug 2010
    Type Conference
    Year 1998
    Where ITC
    Authors Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng
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