| Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices Recent countries visiting this post |  |
 | 6 | United States |
 | 1 | |
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| Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices Recent countries visiting this post | |
| 6 | United States |
| 1 | |
| 1 | Denmark |
| 1 | China |
| 1 | Russian Federation |