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DATE
2009
IEEE

Automated data analysis solutions to silicon debug

9 years 8 months ago
Automated data analysis solutions to silicon debug
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper presents an automated software solution to analyze the data collected during silicon debug. The proposed methodology analyzes the test sequences to detect suspects in both the spatial and the temporal domain. A set of software debug techniques are proposed to analyze the acquired data from the hardware testing and provide suggestions for the setup of the test environment in the next debug session. A comprehensive set of experiments demonstrate its effectiveness in terms of run-time and resolution.
Yu-Shen Yang, Nicola Nicolici, Andreas G. Veneris
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where DATE
Authors Yu-Shen Yang, Nicola Nicolici, Andreas G. Veneris
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