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DAC
2004
ACM

Automatic generation of breakpoint hardware for silicon debug

10 years 1 days ago
Automatic generation of breakpoint hardware for silicon debug
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpoint modules during the design stage of the chip. This paper focuses on an innovative approach to automatically generate breakpoint modules by means of a breakpoint description language. This language is illustrated using an example, and experimental results are presented that show the efficiency and effectiveness of this new method for generating breakpoint hardware. Categories and Subject Descriptors B.8 [Hardware]: Performance and Reliability--Performance Analysis and Design Aids General Terms Design
Bart Vermeulen, Mohammad Zalfany Urfianto, Sandeep
Added 13 Nov 2009
Updated 13 Nov 2009
Type Conference
Year 2004
Where DAC
Authors Bart Vermeulen, Mohammad Zalfany Urfianto, Sandeep Kumar Goel
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