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SIGMETRICS
2005
ACM

Automatic measurement of memory hierarchy parameters

10 years 5 months ago
Automatic measurement of memory hierarchy parameters
The running time of many applications is dominated by the cost of memory operations. To optimize such applications for a given platform, it is necessary to have a detailed knowledge of the memory hierarchy parameters of that platform. In practice, this information is poorly documented if at all. Moreover, there is growing interest in self-tuning, autonomic software systems that can optimize themselves for different platforms; these systems must determine memory hierarchy parameters automatically without human intervention. One solution is to use micro-benchmarks to determine the parameters of the memory hierarchy. In this paper, we argue that existing micro-benchmarks are inadequate, and present novel micro-benchmarks for determining parameters of all levels of the memory hierarchy, including registers, all data caches and the translation look-aside buffer. We have implemented these micro-benchmarks in a tool called X-Ray that can be ported easily to new platforms. We present experi...
Kamen Yotov, Keshav Pingali, Paul Stodghill
Added 26 Jun 2010
Updated 26 Jun 2010
Type Conference
Year 2005
Where SIGMETRICS
Authors Kamen Yotov, Keshav Pingali, Paul Stodghill
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