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TAICPART
2010
IEEE

Bad Pairs in Software Testing

8 years 11 months ago
Bad Pairs in Software Testing
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is a set of N-tuples where every pairwise combination of the parameter values is contained in at least one of the N-tuples. Well-known algorithms generate pairwise test sets far smaller than the test space. Pairwise testing has good tool support and is widely known in industry and academia. Empirical results have shown the effectiveness of the approach. While pairwise testing is used to generate test inputs, we propose a novel analysis of the test outputs. We focus on bad pairs: those which always result in a failed test case. We experimentally evaluate the frequency of occurrence of bad pairs using mutation testing with 1 and 2 faults per mutant. The results provide useful insights into two important relationships: (1) between faults and bad pairs and (2) between input selection and bad pairs. We then apply t...
Daniel Hoffman, Chien Chang, Gary Bazdell, Brett S
Added 30 Jan 2011
Updated 30 Jan 2011
Type Journal
Year 2010
Where TAICPART
Authors Daniel Hoffman, Chien Chang, Gary Bazdell, Brett Stevens, Kevin Yoo
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