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ICPR
2002
IEEE

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Beam Search for Feature Selection in Automatic SVM Defect Classification

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Beam Search for Feature Selection in Automatic SVM Defect Classification

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Puneet Gupta, David S. Doermann, Daniel DeMenthon

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Automatic SVM Defect | Computer Vision | ICPR 2002 |

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Added	09 Nov 2009
Updated	09 Nov 2009
Type	Conference
Year	2002
Where	ICPR
Authors	Puneet Gupta, David S. Doermann, Daniel DeMenthon

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