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ASPDAC
2008
ACM

Best ways to use billions of devices on a chip - Error predictive, defect tolerant and error recovery designs

13 years 6 months ago
Best ways to use billions of devices on a chip - Error predictive, defect tolerant and error recovery designs
Kazutoshi Kobayashi, Hidetoshi Onodera
Added 12 Oct 2010
Updated 12 Oct 2010
Type Conference
Year 2008
Where ASPDAC
Authors Kazutoshi Kobayashi, Hidetoshi Onodera
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