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2006
IEEE

Bilateral Testing of Nano-scale Fault-tolerant Circuits

9 years 1 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. Because fault-tolerant hardwares help to mask the effects caused by increased levels of defects, testing the functionality of the chip together with the embedded fault-tolerance becomes a tremendous challenge. In this paper, a new bilateral testing framework for nano circuits is proposed, where multiple stuck-at faults across different modules in a triple module redundancy (TMR) architecture are considered. In addition, a new test generator is presented for the bilateral testing that takes into account the enormous number of bilateral stuck-at faults possible with new types of guidance in the search, and it can generate a set of vectors that can test the TMR-based nano circuit as a single entity. Experimental results reported for ISCAS'85 and ITC99 circuits demonstrate that the bilateral testing can help...
Lei Fang, Michael S. Hsiao
Added 13 Oct 2010
Updated 13 Oct 2010
Type Conference
Year 2006
Where DFT
Authors Lei Fang, Michael S. Hsiao
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