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COMPSAC
2003
IEEE

BINTEST - Binary Search-based Test Case Generation

13 years 9 months ago
BINTEST - Binary Search-based Test Case Generation
One of the important tasks during software testing is the generation of test cases. Various approaches have been proposed to automate this task. The approaches available, however, often have problems limiting their use. A problem of dynamic test case generation approaches, for instance, is that a large number of iterations can be necessary to obtain test cases. This article proposes a novel algorithm for path-oriented test case generation based on binary search and describes a possible implementation.
Sami Beydeda, Volker Gruhn
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where COMPSAC
Authors Sami Beydeda, Volker Gruhn
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