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    Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices

    13 years 10 months ago
    Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices
    Download  www.icsd2.tj.chiba-u.jp
    Kentaroh Katoh, Hideo Ito
    claim paper
    Added 11 Jun 2010
    Updated 11 Jun 2010
    Type Conference
    Year 2006
    Where ETS
    Authors Kentaroh Katoh, Hideo Ito
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