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Case Study - Using STIL as Test Pattern Language

11 years 6 months ago
Case Study - Using STIL as Test Pattern Language
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture Automated Test Equipment (ATE) platform. The advantages of this approach in extensibility and easy interface with Electronic Design Automation (EDA) tools for the ATE user are presented. Some challenges of using STIL as a general purpose ATE test pattern language are also presented. The overall EDA and ATE strategy and pattern system architecture based upon STIL are discussed.
Daniel Fan, Steve Roehling, Rusty Carruth
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ITC
Authors Daniel Fan, Steve Roehling, Rusty Carruth
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