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DT
2008

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Characterization of Equalized and Repeated Interconnects for NoC Applications

13 years 4 months ago

Characterization of Equalized and Repeated Interconnects for NoC Applications

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Byungsub Kim, Vladimir Stojanovic

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Added	10 Dec 2010
Updated	10 Dec 2010
Type	Journal
Year	2008
Where	DT
Authors	Byungsub Kim, Vladimir Stojanovic

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