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ATS
2000
IEEE

Charge sharing fault analysis and testing for CMOS domino logic circuits

13 years 9 months ago
Charge sharing fault analysis and testing for CMOS domino logic circuits
Because domino logic design offers smaller area and faster delay than conventional CMOS design, it is very popular in the high-performance processor design. However, domino logic suffers from several design problems and one of the most notable ones is the chargesharing problem. In this paper, we describe a method to measure the sensitivity of the charge-sharing problem for each domino gate. In addition, our algorithm also generates test vectors to detect the worst case of chargesharing fault.
Ching-Hwa Cheng, Wen-Ben Jone, Jinn-Shyan Wang, Sh
Added 30 Jul 2010
Updated 30 Jul 2010
Type Conference
Year 2000
Where ATS
Authors Ching-Hwa Cheng, Wen-Ben Jone, Jinn-Shyan Wang, Shih-Chieh Chang
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