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Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults

9 years 4 months ago
Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. As delay testing using external testers requires expensive ATE, built-in self test (BIST) is an alternative technique that can significantly reduce the test cost. The generation of test patterns in this case is usually pseudorandom (produced from an LFSR), and it has been proven that Single Input Change (SIC) test sequences are more effective than classical Multiple Input Change (MIC) test sequences when a high robust delay fault coverage is targeted. In this paper, we first question the use of a pseudo-random generation to produce effective delay test pairs. We demonstrate that using truly random test pairs (produced from a software generation) to test path delay faults in a given circuit produces higher delay fault coverage than that obtained with pseudo-random test pairs obtained from a classical primitive ...
Patrick Girard, Christian Landrault, Serge Pravoss
Added 31 Jul 2010
Updated 31 Jul 2010
Type Conference
Year 2000
Where IOLTS
Authors Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel
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