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8

ATS
2003
IEEE

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Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders

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Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders

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Luigi Dilillo, Patrick Girard, Serge Pravossoudovi

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» Analysis and Test of ResistiveOpen Defects in SRAM PreCharge Circuits

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	ATS
Authors	Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri

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