Compressive confocal microscopy

10 years 4 months ago
Compressive confocal microscopy
In this paper, a new approach for Confocal Microscopy (CM) based on the framework of compressive sensing is developed. In the proposed approach, a point illumination and a random set of pinholes are used to eliminate out-of-focus information at the detector. Furthermore, a Digital Micromirror Device (DMD) is used to efficiently scan the 2D or 3D specimen but, unlike the conventional CM that uses CCD detectors, the measured data in the proposed compressive confocal microscopy (CCM) emerge from random sets of pinhole illuminated pixels in the specimen that are linearly combined (projected) and measured by a single photon detector. Compared to conventional CM or programmable array microscopy (PAM), the number of measurements needed for nearly perfect reconstruction in CCM is significantly reduced. Our experimental results are based on a testbed that uses a Texas Instruments DMD (an array of 1024×768; 13.68×13.68 µm2 mirrors) for computing the linear projections of illuminated pixels ...
Peng Ye, José L. Paredes, Gonzalo R. Arce,
Added 21 May 2010
Updated 21 May 2010
Type Conference
Year 2009
Authors Peng Ye, José L. Paredes, Gonzalo R. Arce, Yuehao Wu, Caihua Chen, Dennis W. Prather
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