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ATS
2005
IEEE

Concurrent Test Generation

13 years 9 months ago
Concurrent Test Generation
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or most) faults in the set. When concurrent tests are generated for fault sets obtained from independence fault collapsing, minimal or near-minimal tests can be expected. This paper gives new simulation-based methods for independence fault collapsing and for deriving concurrent tests using single-fault ATPG.
Vishwani D. Agrawal, Alok S. Doshi
Added 24 Jun 2010
Updated 24 Jun 2010
Type Conference
Year 2005
Where ATS
Authors Vishwani D. Agrawal, Alok S. Doshi
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