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2010

Condenser-Based Instant Reflectometry

8 years 4 months ago
Condenser-Based Instant Reflectometry
We present a technique for rapid capture of high quality bidirectional reflection distribution functions(BRDFs) of surface points. Our method represents the BRDF at each point by a generalized microfacet model with tabulated normal distribution function (NDF) and assumes that the BRDF is symmetrical. A compact and light-weight reflectometry apparatus is developed for capturing reflectance data from each surface point within one second. The device consists of a pair of condenser lenses, a video camera, and six LED light sources. During capture, the reflected rays from a surface point lit by a LED lighting are refracted by a condenser lenses and efficiently collected by the camera CCD. Taking advantage of BRDF symmetry, our reflectometry apparatus provides an efficient optical design to improve the measurement quality. We also propose a model fitting algorithm for reconstructing the generalized microfacet model from the sparse BRDF slices captured from a material surface point. Our new ...
Yanxiang Lan, Yue Dong, Jiaping Wang, Xin Tong, Ba
Added 01 Feb 2011
Updated 01 Feb 2011
Type Journal
Year 2010
Where CGF
Authors Yanxiang Lan, Yue Dong, Jiaping Wang, Xin Tong, Baining Guo
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